CENA Probe

CENA Probe

CENA (Compact Electromagnetic Nondestructive Assessment) Probe

CENA Probe is a Handheld High Sensitivity RF Probe for Nondestructive Evaluation of Resistive Surfaces in the e0-10 Ohm/SQ Range. The probe can be tailored for specific frequencies to accommodate diverse needs. Currently, IERUS has developed CENA Probes with both wideband and X-band capabilities for multiple customers.

Wideband Datasheet

X-Band Surface Resistance Datasheet

X-Band Characterization of Curved Surfaces

Features

Ergonomic Handheld Operation
High Sensitivity
High Polarization Purity
Calibration and Verification Standards
Simple Graphical User Interface
Certified for Class I Division II Operation
CE Certification

Applications

Product Line Inspection
Maintenance Inspection
Material Measurements
Sheet Resistance Characterization
Easy and Accurate Materials Evaluation

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