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CENA Probe

CENA (Compact Electromagnetic Nondestructive Assessment) Probe

CENA Probe is a Handheld High Sensitivity RF Probe for Nondestructive Evaluation of Resistive Surfaces in the e0-10 Ohm/SQ Range. The probe can be tailored for specific frequencies to accommodate diverse needs. Currently, IERUS has developed CENA Probes with both wideband and X-band capabilities for multiple customers.

Features

  • Ergonomic Handheld Operation
  • High Sensitivity
  • High Polarization Purity
  • Calibration and Verification Standards
  • Simple Graphical User Interface
  • Certified for Class I Division II Operation
  • CE Certification

Applications

  • Product Line Inspection
  • Maintenance Inspection
  • Material Measurements
  • Sheet Resistance Characterization
  • Easy and Accurate Materials Evaluation

Request a Demo

Fill out the form below to schedule a time to see CENA in action, plus learn more about how our unique capabilities for material characterization can help solve your difficult materials problems.
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